Darkfield MSZ5419

This dark field device is suitable for microscopes of the A.KRÜSS MSL series and MSZ series.

Dark-field microscopy is used to make the outlines of transparent or low-contrast inclusions recognizable. Here the direct transmitted light is blocked and the stone is only illuminated from the side. This lateral light is reflected and scattered by the inclusions and makes them particularly clearly visible. The result is a light image against a dark background. Places of orgin can be determined by observing inclusions, stone qualities can be determined and forgeries or manipulated stones can be identified.

Practical examples of how sapphires are analyzed with dark-field microscopy or how crystallized rutile needles are viewed can be found in the application article: Using stereomicroscopes to determine places of orgin.

There is also a practical tip on examining inclusions with stereomicroscopes (bright-field microscopy). In the microscopy methods article, you will find background knowledge on investigations with stereomicroscopes and examining under a microscope with immersion liquid.